Fig. 4

Differentially expressed genes (DEGs) found in common across comparisons between tick-infested skin of tick-resistant and tick-susceptible hosts. Genes involved in common in anti-tick responses as well as potential signatures for tick resistance were identified. a Venn diagram showing number of DEGs identified in skins of resistant hosts infested with larvae or nymphs when compared with infested skins of susceptible hosts, (inter-breed comparison). Numbers inside brackets indicate the amount of genes that were upregulated (red), downregulated (green) or of mixed pattern (blue). b Hierarchical clustering of 37 DEGs from the 53 DEGs found in common for infested skins in inter-breed comparisons shown in a (overlap). Note that the infested skins of resistant hosts are grouped separately (rightmost cluster). c Hierarchical clustering of 16 DEGs from the 53 DEGs found in common for infested skins in inter-breed comparisons shown in (a) (overlap). The clustering in (b) and (c) used intensity values (RMA normalized). Abbreviations: S, tick-susceptible hosts; R, tick-resistant hosts; Bsl, baseline skin skin; Str, stressed skin; Lar, larvae-infested skin; Nym, nymph-infested skin